In these cells the diffusion length of minority carriers ( the length that photo-generated carriers can travel before they recombine ) must be large compared to the cell thickness.
32.
The average length an electron travels through the p-type material before recombining is called the " diffusion length ", and it is typically on the order of micrometers.
33.
A typical parameter which governs the signal in this case is the " thermal diffusion length ", which depends on the material and the modulation frequency and ordinarily is in the order of several micrometers.
34.
However, short diffusion length ( diffusivity, D n d " 10 " 4 cm 2 / s ) in titania dye-sensitized solar cells decrease the solar-to-energy conversion efficiency.
35.
The first two layers constituted the photosensitive junction and the third layer constituted a highly doped semiconductor back region present at a distance from the photosensitive junction smaller than a diffusion length of the thermally generated carriers.
36.
As described above, dispersed heterojunctions of donor-acceptor organic materials have high quantum efficiencies compared to the planar hetero-junction, because in dispersed heterojunctions it is more likely for an exciton to find an interface within its diffusion length.
37.
Compared to earlier work, this approach improved spatial resolution because the use of short laser pulses reduced the duration of the thermal expansion pulse to the point that the thermal diffusion lengths can be on the scale of nanometres rather than microns.
38.
In particular, single-nanocrystal ('channel') devices, an array of single p-n junctions between the electrodes and separated by a period of about a diffusion length, represent a new architecture for solar cells and potentially high efficiency.
39.
However, annealing for too long causes the polymer domain size to increase, eventually making it larger than the exciton diffusion length, and possibly allowing some of the metal from the contact to diffuse into the photoactive layer, reducing the efficiency of the device.
40.
In a real semiconductor, the measured diffusion length L _ \ mathrm { meas } = \ sqrt { D \ tau _ \ mathrm { eff } } includes the effect of surface recombination, which is best understood through its effect on carrier lifetime:
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